Search results for: Juan Li
Microelectronics Reliability > 2017 > 75 > C > 296-308
2013 25th Chinese Control and Decision Conference (CCDC) > 4869 - 4873
International Journal of Control, Automation and Systems > 2012 > 10 > 1 > 150-157
2010 Chinese Control and Decision Conference > 701 - 706
2009 Chinese Control and Decision Conference > 902 - 907
2009 Chinese Control and Decision Conference > 5242 - 5247
2008 Chinese Control and Decision Conference > 573 - 577