Search results for: J. Ahn
2016 IEEE International Electron Devices Meeting (IEDM) > 27.4.1 - 27.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 26.2.1 - 26.2.4
2012 International Electron Devices Meeting > 31.8.1 - 31.8.4
Electronics Letters > 2008 > 44 > 8 > 539 - 540
29th Annual Proceedings Reliability Physics 1991 > 323 - 326